"A Data-Driven Method for IGBT Open-Circuit Fault Diagnosis Based on Hybrid ..."

Yang Xia, Yan Xu, Bin Gou (2020)

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DOI: 10.1109/TII.2019.2949344

access: closed

type: Journal Article

metadata version: 2020-05-22

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Yang Xia, Yan Xu, Bin Gou:
A Data-Driven Method for IGBT Open-Circuit Fault Diagnosis Based on Hybrid Ensemble Learning and Sliding-Window Classification. IEEE Trans. Ind. Informatics 16(8): 5223-5233 (2020)

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