"Search for a Dual-Convergence Sparse Feature Extractor With Visualization ..."

Yu Sun et al. (2024)

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DOI: 10.1109/TII.2024.3393553

access: closed

type: Journal Article

metadata version: 2024-08-22

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  - https://dblp.org/rec/journals/tii/SunSGZLP24
Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht:
Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection. IEEE Trans. Ind. Informatics 20(8): 10134-10144 (2024)

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