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"Microcrack Defect Quantification Using a Focusing High-Order SH Guided ..."

Hongyu Sun et al. (2022)

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DOI: 10.1109/TII.2021.3105537

access: closed

type: Journal Article

metadata version: 2022-02-23

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  - https://dblp.org/rec/journals/tii/SunPLWZH22
Hongyu Sun, Lisha Peng, Junming Lin, Shen Wang, Wei Zhao, Songling Huang:
Microcrack Defect Quantification Using a Focusing High-Order SH Guided Wave EMAT: The Physics-Informed Deep Neural Network GuwNet. IEEE Trans. Ind. Informatics 18(5): 3235-3247 (2022)

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