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"Diffraction-Compensating Coded Aperture for Inspection in Manufacturing."

Tsutomu Sakuyama et al. (2015)

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DOI: 10.1109/TII.2014.2342374

access: open

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/tii/SakuyamaFIM15
Tsutomu Sakuyama, Takuya Funatomi, Masaaki Iiyama, Michihiko Minoh:
Diffraction-Compensating Coded Aperture for Inspection in Manufacturing. IEEE Trans. Ind. Informatics 11(3): 782-789 (2015)

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