![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
"Cascaded Approach to Defect Location and Classification in Microelectronic ..."
Zhili Long, Xing Zhou, Xiaojun Wu (2020)
- Zhili Long
, Xing Zhou, Xiaojun Wu
:
Cascaded Approach to Defect Location and Classification in Microelectronic Bonded Joints: Improved Level Set and Random Forest. IEEE Trans. Ind. Informatics 16(7): 4403-4412 (2020)
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.