"A Novel Subpixel Industrial Chip Detection Method Based on the Dual-Edge ..."

Weihua Liu, Yuanming Zhang, Xinghu Yu (2023)

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DOI: 10.1109/TII.2022.3158674

access: closed

type: Journal Article

metadata version: 2022-12-05

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Weihua Liu, Yuanming Zhang, Xinghu Yu:
A Novel Subpixel Industrial Chip Detection Method Based on the Dual-Edge Model for Surface Mount Equipment. IEEE Trans. Ind. Informatics 19(1): 232-242 (2023)

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