"Capturing High-Discriminative Fault Features for Electronics-Rich Analog ..."

Zhenbao Liu et al. (2017)

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DOI: 10.1109/TII.2017.2690940

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type: Journal Article

metadata version: 2022-01-03

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Zhenbao Liu, Zhen Jia, Chi-Man Vong, Shuhui Bu, Junwei Han, Xiaojun Tang:
Capturing High-Discriminative Fault Features for Electronics-Rich Analog System via Deep Learning. IEEE Trans. Ind. Informatics 13(3): 1213-1226 (2017)

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