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"A Novel Chip-on-Board Defect Detection Approach Combining Infrared Thermal ..."

Ye Jiang et al. (2024)

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DOI: 10.1109/TII.2024.3366251

access: closed

type: Journal Article

metadata version: 2024-05-31

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Ye Jiang, Zhiyong Liu, Guanglan Liao, Bo Ma:
A Novel Chip-on-Board Defect Detection Approach Combining Infrared Thermal Evolution and Self-Supervised Transformer. IEEE Trans. Ind. Informatics 20(5): 8044-8054 (2024)

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