"Adversarial Autoencoder Based Feature Learning for Fault Detection in ..."

Kyojin Jang et al. (2022)

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DOI: 10.1109/TII.2021.3078414

access: closed

type: Journal Article

metadata version: 2021-12-15

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Kyojin Jang, Seokyoung Hong, Minsu Kim, Jonggeol Na, Il Moon:
Adversarial Autoencoder Based Feature Learning for Fault Detection in Industrial Processes. IEEE Trans. Ind. Informatics 18(2): 827-834 (2022)

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