"Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment."

Michelangelo Grosso, Hipólito Guzmán-Miranda, Miguel A. Aguirre (2013)

> Home

Details and statistics

DOI: 10.1109/TII.2012.2226096

access: closed

type: Journal Article

metadata version: 2020-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tii/GrossoGA13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tii/GrossoGA13
Michelangelo Grosso, Hipólito Guzmán-Miranda, Miguel A. Aguirre:
Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment. IEEE Trans. Ind. Informatics 9(1): 142-148 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.