"A Control Theory Informed Machine Learning-Based Modeling and Monitoring ..."

Danijel Cuturic et al. (2025)

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DOI: 10.1109/TII.2025.3576870

access: open

type: Journal Article

metadata version: 2025-11-02

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Danijel Cuturic, Jonah V. Weidemann, Steven X. Ding, Frank Einar Kruis, Micha S. Obergfell, Chris Louen:
A Control Theory Informed Machine Learning-Based Modeling and Monitoring of Nanoparticle Generation Processes. IEEE Trans. Ind. Informatics 21(10): 7455-7465 (2025)

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