"An Adaptive Deep Learning Framework for Fast Recognition of Integrated ..."

Zhongshu Chen et al. (2022)

> Home

Details and statistics

DOI: 10.1109/TII.2021.3093388

access: closed

type: Journal Article

metadata version: 2022-01-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tii/ChenZZXL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tii/ChenZZXL22
Zhongshu Chen, Changhua Zhang, Lin Zuo, Tangfan Xiahou, Yu Liu:
An Adaptive Deep Learning Framework for Fast Recognition of Integrated Circuit Markings. IEEE Trans. Ind. Informatics 18(4): 2486-2496 (2022)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.