"ICMarkingNet: An Ultrafast and Streamlined Deep Model for IC Marking ..."

Zhongshu Chen et al. (2025)

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DOI: 10.1109/TII.2024.3453968

access: closed

type: Journal Article

metadata version: 2025-02-14

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Zhongshu Chen, Feng Guo, Lin Zuo, Yu Liu:
ICMarkingNet: An Ultrafast and Streamlined Deep Model for IC Marking Inspection. IEEE Trans. Ind. Informatics 21(1): 554-563 (2025)

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