"Simplified Subspaced Regression Network for Identification of Defect ..."

Fatima Adly et al. (2015)

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DOI: 10.1109/TII.2015.2481719

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type: Journal Article

metadata version: 2024-03-25

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Fatima Adly, Omar Alhussein, Paul D. Yoo, Yousof Al-Hammadi, Kamal Taha, Sami Muhaidat, Young-Seon Jeong, Uihyoung Lee, Mohammed Ismail:
Simplified Subspaced Regression Network for Identification of Defect Patterns in Semiconductor Wafer Maps. IEEE Trans. Ind. Informatics 11(6): 1267-1276 (2015)

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