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"Monitoring Device Current to Characterize Trim Operations of Solid-State ..."

James Shey et al. (2019)

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DOI: 10.1109/TIFS.2018.2876835

access: closed

type: Journal Article

metadata version: 2020-08-06

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  - https://dblp.org/rec/journals/tifs/SheyBWTNRF19
James Shey, Justin A. Blanco, T. Owens Walker, Thomas W. Tedesso, Hau T. Ngo, Ryan N. Rakvic, Kevin D. Fairbanks:
Monitoring Device Current to Characterize Trim Operations of Solid-State Drives. IEEE Trans. Inf. Forensics Secur. 14(5): 1296-1306 (2019)

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