"Non-Invasive Recognition of Poorly Resolved Integrated Circuit Elements."

Erik Matlin, Motilal Agrawal, David Stoker (2014)

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DOI: 10.1109/TIFS.2013.2297518

access: closed

type: Journal Article

metadata version: 2020-08-06

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Erik Matlin, Motilal Agrawal, David Stoker:
Non-Invasive Recognition of Poorly Resolved Integrated Circuit Elements. IEEE Trans. Inf. Forensics Secur. 9(3): 354-363 (2014)

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