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"Noise Immunity and its Temperature Characteristics Study of the ..."
Jing Zhu et al. (2018)
- Jing Zhu, Yunwu Zhang, Weifeng Sun, Yangyang Lu, Longxing Shi, Yan Gu, Sen Zhang:
Noise Immunity and its Temperature Characteristics Study of the Capacitive-Loaded Level Shift Circuit for High Voltage Gate Drive IC. IEEE Trans. Ind. Electron. 65(4): 3027-3034 (2018)
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