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"Study and Implementation of 600-V High-Voltage Gate Driver IC With the ..."

Jing Zhu et al. (2021)

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DOI: 10.1109/TIE.2020.2970673

access: closed

type: Journal Article

metadata version: 2022-07-12

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  - https://dblp.org/rec/journals/tie/ZhuYLSCYZLZZHG21
Jing Zhu, Siyuan Yu, Yangyang Lu, Weifeng Sun, Chuanyi Cheng, Ding Yan, Yunwu Zhang, Shaohong Li, Long Zhang, Sen Zhang, Nailong He, Yan Gu:
Study and Implementation of 600-V High-Voltage Gate Driver IC With the Common-Mode Dual-Interlock Technique for GaN Devices. IEEE Trans. Ind. Electron. 68(2): 1506-1514 (2021)

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