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"Short Circuit Capability Characterization and Analysis of p-GaN Gate ..."
Jiahui Sun et al. (2021)
- Jiahui Sun
, Jin Wei
, Zheyang Zheng
, Kevin J. Chen
:
Short Circuit Capability Characterization and Analysis of p-GaN Gate High-Electron-Mobility Transistors Under Single and Repetitive Tests. IEEE Trans. Ind. Electron. 68(9): 8798-8807 (2021)

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