"SIR-Aided Dynamic Canonical Correlation Analysis for Fault Detection and ..."

Long Gao et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TIE.2023.3337553

access: closed

type: Journal Article

metadata version: 2024-06-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tie/GaoLCDL24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tie/GaoLCDL24
Long Gao, Donghui Li, Zhiwen Chen, Steven X. Ding, Hao Luo:
SIR-Aided Dynamic Canonical Correlation Analysis for Fault Detection and Isolation of Industrial Automation Systems. IEEE Trans. Ind. Electron. 71(9): 11560-11570 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.