"Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis ..."

Nikolaos Dimitriou et al. (2020)

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DOI: 10.1109/TIE.2019.2931220

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
Fault Diagnosis in Microelectronics Attachment Via Deep Learning Analysis of 3-D Laser Scans. IEEE Trans. Ind. Electron. 67(7): 5748-5757 (2020)

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