"HOS-based nonparametric and parametric methodologies for machine fault ..."

Tommy W. S. Chow, Hongzhou Tan (2000)

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DOI: 10.1109/41.873213

access: closed

type: Journal Article

metadata version: 2020-05-22

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Tommy W. S. Chow, Hongzhou Tan:
HOS-based nonparametric and parametric methodologies for machine fault detection. IEEE Trans. Ind. Electron. 47(5): 1051-1059 (2000)

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