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"Uncertainty Quantification in Intelligent-Based Electrical Resistivity ..."

Lan Xixi et al. (2023)

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DOI: 10.1109/TGRS.2023.3262835

access: closed

type: Journal Article

metadata version: 2023-04-29

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Lan Xixi, Changchun Zou, Cheng Peng, Caowei Wu:
Uncertainty Quantification in Intelligent-Based Electrical Resistivity Tomography Image Reconstruction With Monte Carlo Dropout Strategy. IEEE Trans. Geosci. Remote. Sens. 61: 1-16 (2023)

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