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"A Large Scale Characterization of Device Uptimes."
Mateus Schulz Nogueira et al. (2023)
- Mateus Schulz Nogueira
, Erica da Cunha Ferreira
, Pedro Tubenchlak Boechat
, Felipe Assis
, Estevão Rabello Ussler
, Rafael Rodrigo Furtado do Nascimento, Daniel Sadoc Menasché
, Geraldo Xexéo
, Abhishek Ramchandran
, Katinka Wolter
:
A Large Scale Characterization of Device Uptimes. IEEE Trans. Emerg. Top. Comput. 11(3): 553-565 (2023)
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