"Early Detection of Reliability Problems Using Information From Warranty ..."

Huaiqing Wu, William Q. Meeker (2002)

> Home

Details and statistics

DOI: 10.1198/004017002317375073

access: closed

type: Journal Article

metadata version: 2017-05-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/technometrics/WuM02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/technometrics/WuM02
Huaiqing Wu, William Q. Meeker:
Early Detection of Reliability Problems Using Information From Warranty Databases. Technometrics 44(2): 120-133 (2002)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.