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"Early Detection of Reliability Problems Using Information From Warranty ..."

Huaiqing Wu, William Q. Meeker (2002)

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DOI: 10.1198/004017002317375073

access: closed

type: Journal Article

metadata version: 2017-05-27

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  - https://dblp.org/rec/journals/technometrics/WuM02
Huaiqing Wu, William Q. Meeker:
Early Detection of Reliability Problems Using Information From Warranty Databases. Technometrics 44(2): 120-133 (2002)

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