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"Measurement System Analysis for Binary Data."

Wessel N. van Wieringen, Jeroen de Mast (2008)

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DOI: 10.1198/004017008000000415

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/technometrics/WieringenM08
Wessel N. van Wieringen, Jeroen de Mast:
Measurement System Analysis for Binary Data. Technometrics 50(4): 468-478 (2008)

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