Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A Random Onset Model for Degradation of High-Reliability Systems."

Scott A. Vander Wiel et al. (2011)

> Home

Details and statistics

DOI: 10.1198/TECH.2011.09119

access: closed

type: Journal Article

metadata version: 2019-10-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/technometrics/WielWGR11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/technometrics/WielWGR11
Scott A. Vander Wiel, Alyson G. Wilson, Todd L. Graves, C. Shane Reese:
A Random Onset Model for Degradation of High-Reliability Systems. Technometrics 53(2): 163-172 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.