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"Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests."

Brian P. Weaver, William Q. Meeker (2021)

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DOI: 10.1080/00401706.2019.1695676

access: closed

type: Journal Article

metadata version: 2021-03-02

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Brian P. Weaver, William Q. Meeker:
Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests. Technometrics 63(1): 90-99 (2021)

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