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"Statistical Process Control Using Two Measurement Systems."

Stefan H. Steiner (2000)

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DOI: 10.1080/00401706.2000.10485997

access: closed

type: Journal Article

metadata version: 2017-05-27

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Stefan H. Steiner:
Statistical Process Control Using Two Measurement Systems. Technometrics 42(2): 178-187 (2000)

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