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"Using Accelerated Life Tests Results to Predict Product Field Reliability."

William Q. Meeker, Luis A. Escobar, Yili Hong (2009)

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DOI: 10.1198/TECH.2009.0016

access: closed

type: Journal Article

metadata version: 2018-06-06

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  - https://dblp.org/rec/journals/technometrics/MeekerEH09
William Q. Meeker, Luis A. Escobar, Yili Hong:
Using Accelerated Life Tests Results to Predict Product Field Reliability. Technometrics 51(2): 146-161 (2009)

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