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"Evaluating Experiments for Estimating the Bit Failure Cross-Section of ..."

Nicolas W. Hengartner et al. (2008)

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DOI: 10.1198/004017007000000461

access: closed

type: Journal Article

metadata version: 2018-11-24

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Nicolas W. Hengartner, Sarah Ellen Michalak, Bruce E. Takala, Stephen A. Wender:
Evaluating Experiments for Estimating the Bit Failure Cross-Section of Semiconductors Using a Colored Spectrum Neutron Beam. Technometrics 50(1): 8-14 (2008)

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