"Use of a field programmable gate array for education in manufacturing test ..."

Dirk Niggemeyer, Kevin J. Stephano, Elizabeth M. Rudnick (2001)

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DOI: 10.1109/13.940994

access: closed

type: Journal Article

metadata version: 2020-04-16

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Dirk Niggemeyer, Kevin J. Stephano, Elizabeth M. Rudnick:
Use of a field programmable gate array for education in manufacturing test and automatic test equipment. IEEE Trans. Educ. 44(3): 239-245 (2001)

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