"An Empirical Study on the Insecurity of End-of-Life (EoL) IoT Devices."

Dingding Wang et al. (2024)

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DOI: 10.1109/TDSC.2023.3334017

access: closed

type: Journal Article

metadata version: 2024-07-19

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Dingding Wang, Muhui Jiang, Rui Chang, Yajin Zhou, Hexiang Wang, Baolei Hou, Lei Wu, Xiapu Luo:
An Empirical Study on the Insecurity of End-of-Life (EoL) IoT Devices. IEEE Trans. Dependable Secur. Comput. 21(4): 3501-3514 (2024)

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