"We Can Always Catch You: Detecting Adversarial Patched Objects WITH or ..."

Jiachun Li et al. (2025)

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DOI: 10.1109/TDSC.2025.3596709

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type: Journal Article

metadata version: 2025-11-25

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Jiachun Li, Jianan Feng, Jianjun Huang, Bin Liang:
We Can Always Catch You: Detecting Adversarial Patched Objects WITH or WITHOUT Signature. IEEE Trans. Dependable Secur. Comput. 22(6): 7372-7388 (2025)

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