"Dual-Stage Vertical Feedback for High-Speed Scanning Probe Microscopy."

Andrew J. Fleming (2011)

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DOI: 10.1109/TCST.2010.2040282

access: closed

type: Journal Article

metadata version: 2020-06-08

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Andrew J. Fleming:
Dual-Stage Vertical Feedback for High-Speed Scanning Probe Microscopy. IEEE Trans. Control. Syst. Technol. 19(1): 156-165 (2011)

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