"SD-CED: Detecting Compromised Devices in Software Defined Consumer ..."

Chandan Kumar, Bipal Khanal, Md. Sarfaraj Alam Ansari (2025)

> Home

Details and statistics

DOI: 10.1109/TCE.2025.3596931

access: closed

type: Journal Article

metadata version: 2025-11-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tce/KumarKA25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tce/KumarKA25
Chandan Kumar, Bipal Khanal, Md. Sarfaraj Alam Ansari:
SD-CED: Detecting Compromised Devices in Software Defined Consumer Electronics Environment. IEEE Trans. Consumer Electron. 71(3): 7741-7755 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.