"Closed space RFI testing."

Isaac M. Bell (1999)

> Home

Details and statistics

DOI: 10.1109/30.793625

access: closed

type: Journal Article

metadata version: 2020-07-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tce/Bell99
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tce/Bell99
Isaac M. Bell:
Closed space RFI testing. IEEE Trans. Consumer Electron. 45(3): 860-866 (1999)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.