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"Local R-Symmetry Co-Occurrence: Characterising Leaf Image Patterns for ..."

Bin Wang et al. (2022)

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DOI: 10.1109/TCBB.2020.3031280

access: closed

type: Journal Article

metadata version: 2023-04-03

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Bin Wang, Yongsheng Gao, Xiaohui Yuan, Shengwu Xiong:
Local R-Symmetry Co-Occurrence: Characterising Leaf Image Patterns for Identifying Cultivars. IEEE ACM Trans. Comput. Biol. Bioinform. 19(2): 1018-1031 (2022)

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