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ORCID"An in-Array Build-In Self-Test Scheme for Embedded SRAM Array."
Feng Wei, Xiaole Cui, Sunrui Zhang (2024)
- Feng Wei, Xiaole Cui, Sunrui Zhang:
An in-Array Build-In Self-Test Scheme for Embedded SRAM Array. IEEE Trans. Circuits Syst. II Express Briefs 71(8): 3935-3939 (2024)
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