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"A Study of BER and EVM Degradation in Digital Modulation Schemes Due to ..."

Mohammad Oveisi, Payam Heydari (2022)

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DOI: 10.1109/TCSI.2022.3172707

access: closed

type: Journal Article

metadata version: 2022-08-08

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  - https://dblp.org/rec/journals/tcasI/OveisiH22
Mohammad Oveisi, Payam Heydari:
A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise. IEEE Trans. Circuits Syst. I Regul. Pap. 69(8): 3402-3415 (2022)

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