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"Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS."

Peng Chen et al. (2022)

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DOI: 10.1109/TCSI.2021.3105451

access: open

type: Journal Article

metadata version: 2023-07-27

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  - journals/tcasI/ChenYZMMS22
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  - https://dblp.org/rec/journals/tcasI/ChenYZMMS22
Peng Chen, Jun Yin, Feifei Zhang, Pui-In Mak, Rui Paulo Martins, Robert Bogdan Staszewski:
Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 69(1): 196-206 (2022)

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