"Circuit Reliability Comparison Between Stochastic Computing and Binary ..."

Zuodong Zhang et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TCSII.2020.2993273

access: closed

type: Journal Article

metadata version: 2025-07-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tcas/ZhangWZZGH20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tcas/ZhangWZZGH20
Zuodong Zhang, Runsheng Wang, Zhe Zhang, Yawen Zhang, Shaofeng Guo, Ru Huang:
Circuit Reliability Comparison Between Stochastic Computing and Binary Computing. IEEE Trans. Circuits Syst. 67-II(12): 3342-3346 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.