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"A Test Vector Generation Method Based on Symbol Error Probabilities for ..."

Javier Valls et al. (2019)

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DOI: 10.1109/TCSI.2018.2882876

access: closed

type: Journal Article

metadata version: 2020-05-22

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Javier Valls, Vicente Torres, María José Canet, Francisco Miguel Garcia-Herrero:
A Test Vector Generation Method Based on Symbol Error Probabilities for Low-Complexity Chase Soft-Decision Reed-Solomon Decoding. IEEE Trans. Circuits Syst. I Regul. Pap. 66-I(6): 2198-2207 (2019)

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