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"Combined Parametric and Worst Case Circuit Analysis via Taylor Models."

Riccardo Trinchero et al. (2016)

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DOI: 10.1109/TCSI.2016.2546389

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tcas/TrincheroMDS16
Riccardo Trinchero, Paolo Manfredi, Tongyu Ding, Igor S. Stievano:
Combined Parametric and Worst Case Circuit Analysis via Taylor Models. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(7): 1067-1078 (2016)

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