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"Using Mixed-Signal Defect Simulation to Close the Loop Between Design and ..."

Stephen Sunter, Krzysztof Jurga, Andrew Laidler (2016)

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DOI: 10.1109/TCSI.2016.2616159

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tcas/SunterJL16
Stephen Sunter, Krzysztof Jurga, Andrew Laidler:
Using Mixed-Signal Defect Simulation to Close the Loop Between Design and Test. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(12): 2313-2322 (2016)

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