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"Leakage effects in metal-connected floating-gate circuits."

Ian St. John, Robert M. Fox (2006)

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DOI: 10.1109/TCSII.2006.875317

access: closed

type: Journal Article

metadata version: 2020-05-27

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Ian St. John, Robert M. Fox:
Leakage effects in metal-connected floating-gate circuits. IEEE Trans. Circuits Syst. II Express Briefs 53-II(7): 577-579 (2006)

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