"Aggressive Voltage Scaling Through Fast Correction of Multiple Errors With ..."

Insup Shin, Jae-Joon Kim, Youngsoo Shin (2015)

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DOI: 10.1109/TCSI.2014.2364691

access: closed

type: Journal Article

metadata version: 2020-05-22

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Insup Shin, Jae-Joon Kim, Youngsoo Shin:
Aggressive Voltage Scaling Through Fast Correction of Multiple Errors With Seamless Pipeline Operation. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(2): 468-477 (2015)

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