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"Performance, Metastability, and Soft-Error Robustness Trade-offs for ..."
David Rennie et al. (2012)
- David Rennie, David Li, Manoj Sachdev, Bharat L. Bhuva, Srikanth Jagannathan, Shi-Jie Wen, Richard Wong:
Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS. IEEE Trans. Circuits Syst. I Regul. Pap. 59-I(8): 1626-1634 (2012)
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