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"BIRA With Optimal Repair Rate Using Fault-Free Memory Region for Area ..."

Chang-Hyun Oh, Sae-Eun Kim, Joon-Sung Yang (2017)

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DOI: 10.1109/TCSI.2017.2750702

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/tcas/OhKY17
Chang-Hyun Oh, Sae-Eun Kim, Joon-Sung Yang:
BIRA With Optimal Repair Rate Using Fault-Free Memory Region for Area Reduction. IEEE Trans. Circuits Syst. I Regul. Pap. 64-I(12): 3160-3171 (2017)

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