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"Circuit-Based Characterization of Device Noise Using Phase Noise Data."

Reza Navid, Thomas H. Lee, Robert W. Dutton (2010)

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DOI: 10.1109/TCSI.2009.2033535

access: closed

type: Journal Article

metadata version: 2020-05-22

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Reza Navid, Thomas H. Lee, Robert W. Dutton:
Circuit-Based Characterization of Device Noise Using Phase Noise Data. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(6): 1265-1272 (2010)

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